Integrated in the new VXelements 5.1 release, these application modules have a variety of new features for improved flexibility and optimised metrology performance.
As well as data transfer with Inventor, VXmodel adds algorithm optimisation for combining mesh files, with or without textures, and with different resolutions – regardless of which device generated them, enabling users to combine both the Go!SCAN 20 and Go!SCAN 50 with textures.
VXinspect now allows for STL-STL comparisons for enhanced alignment and comparison of two meshes, along with a direct transfer of data from VXmodel to VXinspect.
For a CAD-free workflow VXinspect has been improved to include alignment creation, overall visibility, Geometric Dimensioning and Tolerancing (GD&T) and numerically defining nominal values.
Increased quality control functions have also been added, allowing the same points to be scanned on a series of produced parts for improved quality control.
“These new enhancements to both VXmodel and VXinspect will provide users with a wide new options to improve their overall manufacturing, reverse engineering and quality control workflows,” said Creaform product manager Simon Côte at the launch.